NEK IEC 63068-3:2020
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
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| Fra | Til | Abonnement | Engangskjøp | Status |
|---|---|---|---|---|
| 26. mai 2026 | Nåværende | 1 593 kr | 3 239 kr | Kan kjøpes |